Analytical Electron Microscopy of Thin Film / Ionic Liquid Interfaces Prepared using a Focused Ion Beam

Title
Analytical Electron Microscopy of Thin Film / Ionic Liquid Interfaces Prepared using a Focused Ion Beam
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume 19, Issue S2, Pages 1636-1637
Publisher
Cambridge University Press (CUP)
Online
2014-05-16
DOI
10.1017/s1431927613010179

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