Journal
MICROSCOPY AND MICROANALYSIS
Volume 17, Issue 1, Pages 34-48Publisher
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927610093979
Keywords
optical microscopy; scanning electron microscopy; stereo microscopy; X-ray ultramicroscopy; lunar regolith
Categories
Funding
- Lehigh/NASA Nanotechnology Agreement
Ask authors/readers for more resources
Complementary state-of-the-art optical, scanning electron, and X-ray microscopy techniques have been used to study the morphology of Apollo 11 lunar soil particles (10084-47). The combination of innovative lighting geometries with image processing of a through focal series of images has allowed us to obtain a unique collection of high-resolution light micrographs of these fascinating particles. Scanning electron microscopy (SEM) stereo-pair imaging has been exploited to illustrate some of the unique morphological properties of lunar regolith. In addition, for the first time, X-ray micrographs with submicron resolution have been taken of individual particles using X-ray ultramicroscopy (XuM). This SEM-based technique lends itself readily to the imaging of pores, cracks, and inclusions and allows the internal structure of an entire particle to be viewed. Rotational SEM and XuM movies have also been constructed from a series of images collected at sequential angles through 360 degrees. These offer a new and insightful view of these complex particles providing size, shape, and spatial information on many of their internal features.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available