TEM Characterization of As-Deposited and Annealed Ni/Al Multilayer Thin Film

Title
TEM Characterization of As-Deposited and Annealed Ni/Al Multilayer Thin Film
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume 16, Issue 06, Pages 662-669
Publisher
Cambridge University Press (CUP)
Online
2010-10-01
DOI
10.1017/s143192761009392x

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