☆ 4.5 Meeting Abstract

Incoherent Bright Field STEM for Imaging and Tomography of Ultra-Thick TEM Cross-sections

MICROSCOPY AND MICROANALYSIS (2009)

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Journal

MICROSCOPY AND MICROANALYSIS
Volume 15, Issue -, Pages 238-239

Publisher

CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927609098067

Keywords

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Categories

Materials Science, Multidisciplinary Microscopy

Funding

  1. Semiconductor Research Corporation and Cornell Center for Materials Research

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