Sub-nanometer Resolution in Field-free Imaging using a Titan 80-300 with Lorentz lens and Image Cs-Corrector at 300kV Acceleration Voltage

Published 2009 View Full Article

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Title
Sub-nanometer Resolution in Field-free Imaging using a Titan 80-300 with Lorentz lens and Image Cs-Corrector at 300kV Acceleration Voltage
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume 15, Issue S2, Pages 184-185
Publisher
Cambridge University Press (CUP)
Online
2009-07-27
DOI
10.1017/s143192760909429x

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