High-Resolution TEM and the Application of Direct and Indirect Aberration Correction

Published 2008 View Full Article

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Title
High-Resolution TEM and the Application of Direct and Indirect Aberration Correction
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume 14, Issue 01, Pages 60-67
Publisher
Cambridge University Press (CUP)
Online
2008-01-03
DOI
10.1017/s1431927608080148

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