Sample preparation by focused ion beam micromachining for transmission electron microscopy imaging in front-view

Published 2013 View Full Article

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Title
Sample preparation by focused ion beam micromachining for transmission electron microscopy imaging in front-view
Authors
Keywords
-
Journal
MICRON
Volume 56, Issue -, Pages 63-67
Publisher
Elsevier BV
Online
2013-10-19
DOI
10.1016/j.micron.2013.10.007

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