Assessment of misorientation in metallic and semiconducting nanowires using precession electron diffraction

Published 2012 View Full Article

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Title
Assessment of misorientation in metallic and semiconducting nanowires using precession electron diffraction
Authors
Keywords
-
Journal
MICRON
Volume 43, Issue 8, Pages 910-915
Publisher
Elsevier BV
Online
2012-03-14
DOI
10.1016/j.micron.2012.03.003

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