Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics

Published 2010 View Full Article

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Title
Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics
Authors
Keywords
-
Journal
MICRON
Volume 41, Issue 7, Pages 722-728
Publisher
Elsevier BV
Online
2010-07-01
DOI
10.1016/j.micron.2010.06.011

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