Simulation and comparison of two sequential logic-in-memory approaches using a dynamic electrochemical metallization cell model

Published 2014 View Full Article

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Title
Simulation and comparison of two sequential logic-in-memory approaches using a dynamic electrochemical metallization cell model
Authors
Keywords
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Journal
MICROELECTRONICS JOURNAL
Volume 45, Issue 11, Pages 1416-1428
Publisher
Elsevier BV
Online
2014-10-17
DOI
10.1016/j.mejo.2014.09.012

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