Functions classification approach to generate reconfigurable fine-grain logic based on Ambipolar Independent Double Gate FET (Am-IDGFET)

Published 2013 View Full Article

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Title
Functions classification approach to generate reconfigurable fine-grain logic based on Ambipolar Independent Double Gate FET (Am-IDGFET)
Authors
Keywords
-
Journal
MICROELECTRONICS JOURNAL
Volume 44, Issue 12, Pages 1316-1327
Publisher
Elsevier BV
Online
2013-10-21
DOI
10.1016/j.mejo.2013.09.001

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