Beyond Black’s equation: Full-chip EM/SM assessment in 3D IC stack

Published 2013 View Full Article

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Title
Beyond Black’s equation: Full-chip EM/SM assessment in 3D IC stack
Authors
Keywords
-
Journal
MICROELECTRONIC ENGINEERING
Volume 120, Issue -, Pages 99-105
Publisher
Elsevier BV
Online
2013-08-24
DOI
10.1016/j.mee.2013.08.013

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