Reliability of III–V devices – The defects that cause the trouble

Published 2011 View Full Article

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Title
Reliability of III–V devices – The defects that cause the trouble
Authors
Keywords
-
Journal
MICROELECTRONIC ENGINEERING
Volume 90, Issue -, Pages 3-8
Publisher
Elsevier BV
Online
2011-04-19
DOI
10.1016/j.mee.2011.04.019

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