Kinetics model incorporating both the chemical and mechanical effects on material removal for copper chemical mechanical polishing

Title
Kinetics model incorporating both the chemical and mechanical effects on material removal for copper chemical mechanical polishing
Authors
Keywords
-
Journal
MICROELECTRONIC ENGINEERING
Volume 91, Issue -, Pages 19-23
Publisher
Elsevier BV
Online
2011-11-09
DOI
10.1016/j.mee.2011.10.011

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