Band offsets at Ge/GeO2 interfaces: Effect of different interfacial bonding patterns

Title
Band offsets at Ge/GeO2 interfaces: Effect of different interfacial bonding patterns
Authors
Keywords
-
Journal
MICROELECTRONIC ENGINEERING
Volume 88, Issue 7, Pages 1467-1470
Publisher
Elsevier BV
Online
2011-04-15
DOI
10.1016/j.mee.2011.03.047

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started