Independent analysis of mechanical data from atomic force microscopy

Title
Independent analysis of mechanical data from atomic force microscopy
Authors
Keywords
-
Journal
MEASUREMENT SCIENCE and TECHNOLOGY
Volume 25, Issue 4, Pages 044009
Publisher
IOP Publishing
Online
2014-03-05
DOI
10.1088/0957-0233/25/4/044009

Ask authors/readers for more resources

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started