Physical characterization and performance evaluation of an x-ray micro-computed tomography system for dimensional metrology applications

Title
Physical characterization and performance evaluation of an x-ray micro-computed tomography system for dimensional metrology applications
Authors
Keywords
-
Journal
MEASUREMENT SCIENCE and TECHNOLOGY
Volume 23, Issue 8, Pages 085404
Publisher
IOP Publishing
Online
2012-06-14
DOI
10.1088/0957-0233/23/8/085404

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