Frequency response of higher cantilever eigenmodes in bimodal and trimodal tapping mode atomic force microscopy

Published 2010 View Full Article

Authors

Keywords

Journal

MEASUREMENT SCIENCE and TECHNOLOGY

Volume 21, Issue 12, Pages 125502

Publisher

IOP Publishing

Online

2010-11-16

DOI

10.1088/0957-0233/21/12/125502

References

View 5 related references

Ask authors/readers for more resources

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

MEASUREMENT SCIENCE and TECHNOLOGY

Ask authors/readers for more resources

Protocol

Reagent

Reprint

Publish scientific posters with Peeref

Create your own webinar