Nonlinear distortion in atomic force microscopy (AFM) measurements

Published 2009 View Full Article

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Title
Nonlinear distortion in atomic force microscopy (AFM) measurements
Authors
Keywords
-
Journal
MEASUREMENT SCIENCE and TECHNOLOGY
Volume 20, Issue 8, Pages 084018
Publisher
IOP Publishing
Online
2009-07-01
DOI
10.1088/0957-0233/20/8/084018

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