Toward an automatic wheat purity measuring device: A machine vision-based neural networks-assisted imperialist competitive algorithm approach

Published 2014 View Full Article

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Title
Toward an automatic wheat purity measuring device: A machine vision-based neural networks-assisted imperialist competitive algorithm approach
Authors
Keywords
-
Journal
MEASUREMENT
Volume 55, Issue -, Pages 196-205
Publisher
Elsevier BV
Online
2014-05-21
DOI
10.1016/j.measurement.2014.05.003

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