Drastic reduction of RRAM reset current via plasma oxidization of TaOx film

Title
Drastic reduction of RRAM reset current via plasma oxidization of TaOx film
Authors
Keywords
-
Journal
APPLIED SURFACE SCIENCE
Volume 324, Issue -, Pages 275-279
Publisher
Elsevier BV
Online
2014-11-02
DOI
10.1016/j.apsusc.2014.10.133

Ask authors/readers for more resources

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now