Topographic characterization of the self-assembled nanostructures of chitosan on mica surface by atomic force microscopy

Published 2015 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Topographic characterization of the self-assembled nanostructures of chitosan on mica surface by atomic force microscopy
Authors
Keywords
Self-assembly, Chitosan, Nanostructures, Mica, Atomic force microscopy
Journal
APPLIED SURFACE SCIENCE
Volume 353, Issue -, Pages 757-763
Publisher
Elsevier BV
Online
2015-07-11
DOI
10.1016/j.apsusc.2015.06.193

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.