Journal
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
Volume 568, Issue -, Pages 49-60Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.msea.2013.01.033
Keywords
EBSD; Electron microscopy; Nanostructured materials; Grain growth
Categories
Funding
- US Department of Energy Office of Basic Energy Sciences, Division of Materials Science [DEFG-02-07ER46443]
- Lockheed Martin Corporation for the U.S. Department of Energy's National Nuclear Security Administration [DE-AC04-94AL85000]
- Division of Materials Science and Engineering, Office of Basic Energy Sciences, U.S. Department of Energy at Sandia
- National Science Foundation
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The effects of NiO multilayer additions to pulsed-laser deposited nanocrystalline Ni on the grain growth and texture evolution during annealing have been studied using a combination of in situ annealing in the transmission electron microscope and the recently developed transmission electron backscatter diffraction technique. Grain growth in pure Ni proceeds in an abnormal manner with a small number of grains growing rapidly at the expense of the surrounding nanocrystalline matrix. The addition of NiO layers in the Ni suppressed grain growth and twin formation upon annealing, with increasing oxide content resulting in decreasing extent of grain growth. In pure Ni, the post-annealing texture was found to be composed of a strong {001} texture coupled with the four {122} twin variants from the {001}. With the addition of NiO, annealing twinning, and hence the {122} orientation, was suppressed and instead the final texture was composed of the {001} and {111} orientations. (c) 2013 Elsevier B.V. All rights reserved.
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