Journal
MATERIALS CHEMISTRY AND PHYSICS
Volume 133, Issue 2-3, Pages 1101-1107Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.matchemphys.2012.02.022
Keywords
LiCoO2; Thin films; PLD; Microstructure; STEM
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Funding
- Japan Society for the Promotion of Science (JSPS)
- National Natural Science Foundation of China [50902051]
- State Key Laboratory of High Performance Ceramics and Superfine Microstructure [SKL201008SIC]
- Grants-in-Aid for Scientific Research [19053003] Funding Source: KAKEN
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Microstructures of epitaxial LiCoO2 thin films formed on the (0 0 0 1) surface of sapphire (alpha-Al2O3) substrates by pulsed laser deposition at room temperature and annealed at 600 degrees C in air were investigated by a combination of selected-area electron diffraction, high-resolution transmission electron microscopy, spherical-aberration-corrected high-angle annular dark-field scanning transmission electron microscopy, and electron energy-loss spectroscopy. As-deposited LiCoO2 thin films consisted of epitaxial grains of the fully cation-disordered phase (gamma) with a cubic rock-salt structure. During annealing, this cubic-structured phase transformed into the fully ordered trigonal (alpha) phase oriented with its basal plane parallel to the surface of the sapphire substrate. Although overall the film appeared to be a single crystal, a small number of Co3O4 grains were also observed in annealed thin films, indicating that some Li and O had been lost during processing. The atomically sharp interface between the film and substrate also became rougher during annealing, with step defects being formed, suggesting that a localized reaction occurred at the interface. (C) 2012 Elsevier B.V. All rights reserved.
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