Composition, annealing and thickness dependence of structural and optical studies on Zn1−xMnxS nanocrystalline semiconductor thin films

Published 2011 View Full Article

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Title
Composition, annealing and thickness dependence of structural and optical studies on Zn1−xMnxS nanocrystalline semiconductor thin films
Authors
Keywords
-
Journal
MATERIALS CHEMISTRY AND PHYSICS
Volume 132, Issue 2-3, Pages 581-590
Publisher
Elsevier BV
Online
2011-12-21
DOI
10.1016/j.matchemphys.2011.11.072

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