EM algorithm for one-shot device testing with competing risks under exponential distribution

Published 2015 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
EM algorithm for one-shot device testing with competing risks under exponential distribution
Authors
Keywords
EM algorithm, Inequality constrained least squares, One-shot device, Competing risks, Masked data, Exponential distribution, ED01 Data
Journal
RELIABILITY ENGINEERING & SYSTEM SAFETY
Volume 137, Issue -, Pages 129-140
Publisher
Elsevier BV
Online
2015-01-14
DOI
10.1016/j.ress.2014.12.014

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.