4.4 Article

Ultra-small-angle X-ray scattering study of PET/PC nanolayers and comparison to AFM results

Journal

MACROMOLECULAR CHEMISTRY AND PHYSICS
Volume 209, Issue 13, Pages 1367-1373

Publisher

WILEY-V C H VERLAG GMBH
DOI: 10.1002/macp.200700639

Keywords

atomic force microscopy (AFM); co-extrusion; nanolayers; structure; ultra-small-angle X-ray scattering (USAXS)

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The forced assembly of two immiscible polymers, produced by layer-multiplying co-extrusion, is analyzed by means of USAXS. Comparison of scattering and AFM results sheds light on many details of the nanolayered structure in PET/PC films. The role played by the volume concentration and cold crystallization of PET on the experimental scattering is discussed. The appearance of at least two scattering maxima in all cases, corresponding to higher orders of the same repeating distance, accounts for the high regularity of the developed nanostructure. It is finally shown that long spacing values, derived from a localized area in AFM, are in a good agreement with the USAXS values averaged over much larger areas.

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