Layered critical values: a powerful direct-adjustment approach to discovering significant patterns

Published 2008 View Full Article

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Title
Layered critical values: a powerful direct-adjustment approach to discovering significant patterns
Authors
Keywords
-
Journal
MACHINE LEARNING
Volume 71, Issue 2-3, Pages 307-323
Publisher
Springer Nature
Online
2008-03-07
DOI
10.1007/s10994-008-5046-x

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