Anti-reflection textured structures by wet etching and island lithography for surface-enhanced Raman spectroscopy

Published 2015 View Full Article

Authors

Keywords

Surface-enhanced Raman scattering, Anti-reflection, Wet etching, Island lithography, Nanostructure, Textured substrate, Finite-difference time-domain method

Journal

APPLIED SURFACE SCIENCE

Volume 357, Issue -, Pages 615-621

Publisher

Elsevier BV

Online

2015-09-08

DOI

10.1016/j.apsusc.2015.09.047

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