Analysis of precious metals at parts-per-billion levels in industrial applications

Published 2015 View Full Article

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Title
Analysis of precious metals at parts-per-billion levels in industrial applications
Authors
Keywords
X-ray fluorescence, Gamma activation analysis, Trace elements, Mineral assay
Journal
RADIATION PHYSICS AND CHEMISTRY
Volume 116, Issue -, Pages 43-47
Publisher
Elsevier BV
Online
2015-01-08
DOI
10.1016/j.radphyschem.2015.01.006

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