Quantitative x-ray spectrometric analysis with peak to Compton ratios

Standardization with the scattered x-rays compensates several phenomenons as absorption-enhancement effects, particle size, surface texture effects, packing density and some instrument error. In this work, we used the scattered peak ratio method for quantitative analysis. The samples were prepared from PbO and HgO powders. The calibration curves were created from the intensity ratios of J(coh)/J(Comp), I-L beta/I-Comp, I-K alpha 1/I-Comp and I-K alpha 2/I-Comp, one for MO sample and the other for HgO sample, versus concentration in EDXRF (energy dispersive x-ray fluorescence) system. MO and HgO targets of various concentrations were excited by 59.54 keV gamma-rays from a 5 Ci Am-241 annular radioactive source in EDXRF system. The emitted and scattered x-rays by samples were counted by an HPGe detector with a resolution of 182 eV at 5.9 keV at a scattering angle of 168 degrees. Also, WDXRF (wavelength dispersive x-ray fluorescence) system was used to compare the concentrations determined by using EDXRF system. It can conclude that the peak to Compton ratio is highly reliable for quantitative analysis and the calculated concentrations are in good agreement with the EDXRF and WDXRF results. This work is important because MO and HgO are used extensively as shielding material and catalyst in the chemical reactions. (C) 2015 Elsevier Ltd. All rights reserved.