Spectroscopic ellipsometry—A perspective

Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability

(2013) T. N. Stanislavchuk et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Growth analysis of (Ag,Cu)InSe2 thin films via real time spectroscopic ellipsometry

(2012) S. A. Little et al.   APPLIED PHYSICS LETTERS

Photo selective protein immobilization using bovine serum albumin

(2012) Wan-Joong Kim et al.   APPLIED SURFACE SCIENCE

Imaging Mie ellipsometry: dynamics of nanodust clouds in an argon–acetylene plasma

(2012) Franko Greiner et al.   PLASMA SOURCES SCIENCE & TECHNOLOGY

Dielectric function of Al-rich AlInN in the range 1-18 eV

(2011) E. Sakalauskas et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Optical anisotropy of A- and M-plane InN grown on free-standing GaN substrates

(2010) P. Schley et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Valence-band splitting and optical anisotropy of AlN

(2010) G. Rossbach et al.   PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS

Terahertz ellipsometry and terahertz optical-Hall effect

(2010) T. Hofmann et al.   THIN SOLID FILMS

Dual rotating compensator ellipsometry: Theory and simulations

(2010) Jian Li et al.   THIN SOLID FILMS

Analysis of textured films and periodic grating structures with Mueller matrices: A new challenge in instrumentation with the generation of angle-resolved SE polarimeters

(2010) F. Ferrieu et al.   THIN SOLID FILMS

Application of ellipsometry techniques to biological materials

(2010) Hans Arwin   THIN SOLID FILMS

The intertwined history of polarimetry and ellipsometry

(2010) R.M.A. Azzam   THIN SOLID FILMS

The nearly aligned rotating-monoplate compensator

(2008) M. Asar et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE