Quantitative analysis of the density of trap states at the semiconductor-dielectric interface in organic field-effect transistors
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Title
Quantitative analysis of the density of trap states at the semiconductor-dielectric interface in organic field-effect transistors
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 107, Issue 10, Pages 103303
Publisher
AIP Publishing
Online
2015-09-12
DOI
10.1063/1.4930310
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