X-ray Diffraction Study of Electric-field-induced Strains in Polycrystalline BiFeO3 Thin Films at Low Temperature Using Synchrotron Radiation

Authors

Keywords

Journal

Volume 59, Issue 3(1), Pages 2556-2559

Publisher

Korean Physical Society

Online

2011-09-15

DOI

10.3938/jkps.59.2556

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