Direct probing of electron and hole trapping into nano-floating-gate in organic field-effect transistor nonvolatile memories
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Title
Direct probing of electron and hole trapping into nano-floating-gate in organic field-effect transistor nonvolatile memories
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 106, Issue 12, Pages 123303
Publisher
AIP Publishing
Online
2015-03-26
DOI
10.1063/1.4916511
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