Probing Degradation by IL-TEM: The Influence of Stress Test Conditions on the Degradation Mechanism

Title
Probing Degradation by IL-TEM: The Influence of Stress Test Conditions on the Degradation Mechanism
Authors
Keywords
-
Journal
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
Volume 160, Issue 6, Pages F608-F615
Publisher
The Electrochemical Society
Online
2013-03-31
DOI
10.1149/2.078306jes

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started