Self-Consistent Technique for Extracting Density of States in Amorphous InGaZnO Thin Film Transistors

Density of States of a-InGaZnO From Temperature-Dependent Field-Effect Studies

(2009) Charlene Chen et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Trap densities in amorphous-InGaZnO4 thin-film transistors

(2008) Mutsumi Kimura et al.   APPLIED PHYSICS LETTERS

Bulk-Limited Current Conduction in Amorphous InGaZnO Thin Films

(2008) Hyun-Joong Chung et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Extraction of Density of States in Amorphous GaInZnO Thin-Film Transistors by Combining an Optical Charge Pumping and Capacitance–Voltage Characteristics

(2008) Jun-Hyun Park et al.   IEEE ELECTRON DEVICE LETTERS

Effects of oxygen gas pressure on structural, electrical, and thermoelectric properties of (ZnO)3In2O3 thin films deposited by rf magnetron sputtering

(2008) Yuki Orikasa et al.   JOURNAL OF APPLIED PHYSICS

An Analytical Model Based on Surface Potential for a-Si:H Thin-Film Transistors

(2008) Yuan Liu et al.   Journal of Display Technology

Optical and Carrier Transport Properties of Cosputtered Zn–In–Sn–O Films and Their Applications to TFTs

(2008) Kachirayil J. Saji et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Transparent, high mobility InGaZnO thin films deposited by PLD

(2007) Arun Suresh et al.   THIN SOLID FILMS