Ultrafast Charge Carrier Recombination and Trapping in Hematite Photoanodes under Applied Bias

Title
Ultrafast Charge Carrier Recombination and Trapping in Hematite Photoanodes under Applied Bias
Authors
Keywords
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Journal
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
Volume 136, Issue 28, Pages 9854-9857
Publisher
American Chemical Society (ACS)
Online
2014-06-21
DOI
10.1021/ja504473e

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