Characterization of Photoinduced Self-Exchange Reactions at Molecule–Semiconductor Interfaces by Transient Polarization Spectroscopy: Lateral Intermolecular Energy and Hole Transfer across Sensitized TiO2Thin Films

Published 2011 View Full Article

Authors

Keywords

Journal

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

Volume 133, Issue 39, Pages 15384-15396

Publisher

American Chemical Society (ACS)

Online

2011-08-24

DOI

10.1021/ja200652r

Ask authors/readers for more resources

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

Ask authors/readers for more resources

Protocol

Reagent

Reprint

Create your own webinar

Become a Peeref-certified reviewer