Superresolution Microscopy on the Basis of Engineered Dark States

Title
Superresolution Microscopy on the Basis of Engineered Dark States
Authors
Keywords
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Journal
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY
Volume 130, Issue 50, Pages 16840-16841
Publisher
American Chemical Society (ACS)
Online
2008-11-25
DOI
10.1021/ja806590m

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