Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 19, Issue -, Pages 789-796Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0909049512027252
Keywords
X-ray nanotomography; focused ion beam; solid-oxide fuel cell; sample preparation
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Funding
- Energy Frontier Research Center on Science Based Nano Structure Design and Synthesis of Heterogeneous Functional Materials for Energy Systems (HeteroFoaM Center)
- US Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-SC0001061, DE-AC02-06CH11357]
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The preparation of hard material samples with the necessary size and shape is critical to successful material analysis. X-ray nanotomography requires that samples are sufficiently thin for X-rays to pass through the sample during rotation for tomography. One method for producing samples that fit the criteria for X-ray nanotomography is focused ion beam/scanning electron microscopy (FIB/SEM) which uses a focused beam of ions to selectively mill around a region of interest and then utilizes a micromanipulator to remove the milled-out sample from the bulk material and mount it on a sample holder. In this article the process for preparing X-ray nanotomography samples in multiple shapes and sizes is discussed. Additionally, solid-oxide fuel cell anode samples prepared through the FIB/SEM technique underwent volume-independence studies for multiple properties such as volume fraction, average particle size, tortuosity and contiguity to observe the characteristics of FIB/SEM samples in X-ray nanotomography.
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