Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 17, Issue -, Pages 473-478Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0909049510016456
Keywords
high-energy X-rays; diffraction; SAXS; WAXS; two-dimensional detectors; multi-length-scale materials
Categories
Ask authors/readers for more resources
Combined small-and wide-angle X-ray scattering (SAXS/WAXS) is a powerful technique for the study of materials at length scales ranging from atomic/molecular sizes (a few angstroms) to the mesoscopic regime (similar to 1 nmto similar to 1 mu m). A set-up to apply this technique at high X-ray energies (E > 50 keV) has been developed. Hard X-rays permit the execution of at least three classes of investigations that are significantly more difficult to perform at standard X-ray energies (8-20 keV): (i) in situ strain analysis revealing anisotropic strain behaviour both at the atomic (WAXS) as well as at the mesoscopic (SAXS) length scales, (ii) acquisition of WAXS patterns to very large q (> 20 angstrom(-1)) thus allowing atomic pair distribution function analysis (SAXS/PDF) of micro-and nano-structured materials, and (iii) utilization of complex sample environments involving thick X-ray windows and/or samples that can be penetrated only by high-energy X-rays. Using the reported set-up a time resolution of approximately two seconds was demonstrated. It is planned to further improve this time resolution in the near future.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available