Surface-sensitive reflection-mode EXAFS from layered sample systems: the influence of surface and interface roughness

Published 2009 View Full Article

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Title
Surface-sensitive reflection-mode EXAFS from layered sample systems: the influence of surface and interface roughness
Authors
Keywords
-
Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 16, Issue 4, Pages 443-454
Publisher
International Union of Crystallography (IUCr)
Online
2009-05-15
DOI
10.1107/s0909049509015684

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