Studying stacking faults in SiC by the XBIC method using a laboratory X-ray source

Published 2014 View Full Article

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Title
Studying stacking faults in SiC by the XBIC method using a laboratory X-ray source
Authors
Keywords
Neutron Technique, Electron Beam Induce Current, Synchrotron Neutron Tech, Multicrystalline Silicon, Laboratory Source
Journal
Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques
Volume 8, Issue 1, Pages 155-157
Publisher
Pleiades Publishing Ltd
Online
2014-02-13
DOI
10.1134/s1027451014010340
References
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