Evaluation of write error rate for voltage-driven dynamic magnetization switching in magnetic tunnel junctions with perpendicular magnetization

Published 2015 View Full Article

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Title
Evaluation of write error rate for voltage-driven dynamic magnetization switching in magnetic tunnel junctions with perpendicular magnetization
Authors
Keywords
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Journal
Applied Physics Express
Volume 9, Issue 1, Pages 013001
Publisher
Japan Society of Applied Physics
Online
2015-12-10
DOI
10.7567/apex.9.013001

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