Raman characterization before and after rapid thermal annealing of CeO2thin films grown by rf sputtering on (111) Si

Published 2008 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Raman characterization before and after rapid thermal annealing of CeO2thin films grown by rf sputtering on (111) Si
Authors
Keywords
-
Journal
JOURNAL OF RAMAN SPECTROSCOPY
Volume 40, Issue 4, Pages 401-404
Publisher
Wiley
Online
2008-10-12
DOI
10.1002/jrs.2140

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.