Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopy

Published 2014 View Full Article

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Title
Model-based prediction of the ohmic resistance of metallic interconnects from oxide scale growth based on scanning electron microscopy
Authors
Keywords
-
Journal
JOURNAL OF POWER SOURCES
Volume 272, Issue -, Pages 595-605
Publisher
Elsevier BV
Online
2014-09-03
DOI
10.1016/j.jpowsour.2014.08.098

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