In situ measurements of stress evolution in silicon thin films during electrochemical lithiation and delithiation

Published 2010 View Full Article

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Title
In situ measurements of stress evolution in silicon thin films during electrochemical lithiation and delithiation
Authors
Keywords
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Journal
JOURNAL OF POWER SOURCES
Volume 195, Issue 15, Pages 5062-5066
Publisher
Elsevier BV
Online
2010-02-13
DOI
10.1016/j.jpowsour.2010.02.013

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