Membrane degradation mechanism during open-circuit voltage hold test

Published 2008 View Full Article

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Title
Membrane degradation mechanism during open-circuit voltage hold test
Authors
Keywords
-
Journal
JOURNAL OF POWER SOURCES
Volume 182, Issue 1, Pages 39-47
Publisher
Elsevier BV
Online
2008-04-08
DOI
10.1016/j.jpowsour.2008.03.078

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