Electron spin resonance observation of an interfacial GePb1-type defect in SiO2/(100)Si1−xGex/SiO2/Si heterostructures

Published 2009 View Full Article

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Title
Electron spin resonance observation of an interfacial GePb1-type defect in SiO2/(100)Si1−xGex/SiO2/Si heterostructures
Authors
Keywords
-
Journal
JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 21, Issue 12, Pages 122201
Publisher
IOP Publishing
Online
2009-02-27
DOI
10.1088/0953-8984/21/12/122201

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